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Understanding Formation of Irradiation-Induced Defects through 4D-STEM, Electron Tomography, and WBDF-STEM

  • Yan-Ru Lin
  • , Yajie Zhao
  • , Michael J Zachman
  • , Jose' D Arregui-Mena
  • , M Grace Burke
  • , Steven J Zinkle

Research output: Contribution to journalArticlepeer-review

Abstract

A major challenge in advancing nuclear materials for next-generation fission and proposed fusion reactors is to comprehensively understand the formation of irradiation-induced defects [1]. It is essential to correlate the evolution of irradiation-induced defects and the degradation of mechanical properties, as they collectively dictate the material's lifespan and ensure nuclear safety [2]. Scanning transmission electron microscopy (STEM) based techniques have emerged as indispensable tools for irradiation-induced defect characterization [3, 4], offering high spatial resolution imaging and chemical analysis, such as electron energy loss spectroscopy (EELS) and energy dispersive X-ray spectroscopy (EDXS). These techniques have been effectively used to obtain an atomic-scale view of the defect structure [5]. Recent advances in electron microscopy, particularly in 4D-STEM [6], offer detailed insight into microstructural evolution by capturing full 2D diffraction patterns at every pixel position. Using high-speed direct electron detectors, this technology generates a four-dimensional dataset, overcoming the limitations of traditional STEM imaging.
Original languageAmerican English
Pages (from-to)ozae044.122
JournalMicroscopy and Microanalysis
Volume30
Issue numberSupplement_1
Early online dateJul 2024
DOIs
StatePublished - Jul 2024

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