Abstract
A xenon capture system that reduces the concentration of xenon in a carrier gas is disclosed. An example xenon capture system includes a carrier gas with a first concentration of xenon that flows through an intake into a chamber. Within the chamber is a reaction area that has at least one peripheral sidewall. The reaction area operates at a predetermined temperature, flow rate, and low pressure. Within the reaction area is at least one xenon capture mechanism that is at least partially formed of a transition metal. When the carrier gas is exposed to the xenon capture mechanism, the xenon capture mechanism adsorbs xenon from the carrier gas. The carrier gas, with a second concentration of xenon, exits the chamber through the exhaust outlet.
Original language | American English |
---|---|
Patent number | 10,773,203 |
State | Published - Sep 2020 |