TY - GEN
T1 - The use of electron backscattered diffraction for material characterization at Chalk River laboratories
AU - Judge, Colin D.
PY - 2010
Y1 - 2010
N2 - Electron Backscattered Diffraction (EBSD) is continuing to emerge as a valuable tool for characterizing polycrystalline engineering materials. This technique permits sub-micron measurements of materials to evaluate localized texture, grain size, grain boundary interactions, and residual plastic deformation. This paper presents the working principles and current potential for characterizing nuclear materials with EBSD.
AB - Electron Backscattered Diffraction (EBSD) is continuing to emerge as a valuable tool for characterizing polycrystalline engineering materials. This technique permits sub-micron measurements of materials to evaluate localized texture, grain size, grain boundary interactions, and residual plastic deformation. This paper presents the working principles and current potential for characterizing nuclear materials with EBSD.
UR - https://www.scopus.com/pages/publications/79958185122
M3 - Conference contribution
AN - SCOPUS:79958185122
SN - 9781617823633
T3 - Canadian Nuclear Society - 31st Annual Conference of the Canadian Nuclear Society and 34th CNS/CNA Student Conference 2010
SP - 336
EP - 345
BT - Canadian Nuclear Society - 31st Annual Conference of the Canadian Nuclear Society and 34th CNS/CNA Student Conference 2010
T2 - 31st Annual Conference of the Canadian Nuclear Society and 34th CNS/CNA Student Conference 2010
Y2 - 24 May 2010 through 27 May 2010
ER -