Structure analysis of CVD graphene films based on HRTEM contrast simulations

Paul Plachinda; Sergei Rouvimov; Raj Solanki

doi:10.1109/NANO.2011.6144403

Structure analysis of CVD graphene films based on HRTEM contrast simulations

Paul Plachinda
, Sergei Rouvimov
, Raj Solanki

Energy & Environmental Science & Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

Abstract

Low-voltage, aberration-corrected, High-Resolution Transmission Electron Microscopy (HRTEM) has proven to be an excellent tool for structure analysis of graphene films, which are typically one or a few atoms thick. Experimental observations of graphene films by HRTEM exhibit several challenges due to low contrast and sensitivity of graphene to intense electron beams. Hence the contrast interpretation requires computer simulations for reliable structure identification. HRTEM contrast simulations of graphene films based on multislice algorithms are presented and compared to experimental results. Stacking sequence, and the number of layers have been analyzed in conjunction with imaging conditions.

Original language	English
Title of host publication	2011 11th IEEE International Conference on Nanotechnology, NANO 2011
Pages	764-769
Number of pages	6
DOIs	https://doi.org/10.1109/NANO.2011.6144403
State	Published - 2011
Event	2011 11th IEEE International Conference on Nanotechnology, NANO 2011 - Portland, OR, United States Duration: Aug 15 2011 → Aug 19 2011

Publication series

Name	Proceedings of the IEEE Conference on Nanotechnology
ISSN (Print)	1944-9399
ISSN (Electronic)	1944-9380

Conference

Conference	2011 11th IEEE International Conference on Nanotechnology, NANO 2011
Country/Territory	United States
City	Portland, OR
Period	08/15/11 → 08/19/11

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10.1109/NANO.2011.6144403

Cite this

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title = "Structure analysis of CVD graphene films based on HRTEM contrast simulations",

abstract = "Low-voltage, aberration-corrected, High-Resolution Transmission Electron Microscopy (HRTEM) has proven to be an excellent tool for structure analysis of graphene films, which are typically one or a few atoms thick. Experimental observations of graphene films by HRTEM exhibit several challenges due to low contrast and sensitivity of graphene to intense electron beams. Hence the contrast interpretation requires computer simulations for reliable structure identification. HRTEM contrast simulations of graphene films based on multislice algorithms are presented and compared to experimental results. Stacking sequence, and the number of layers have been analyzed in conjunction with imaging conditions.",

author = "Paul Plachinda and Sergei Rouvimov and Raj Solanki",

year = "2011",

doi = "10.1109/NANO.2011.6144403",

language = "English",

isbn = "9781457715143",

series = "Proceedings of the IEEE Conference on Nanotechnology",

pages = "764--769",

booktitle = "2011 11th IEEE International Conference on Nanotechnology, NANO 2011",

note = "2011 11th IEEE International Conference on Nanotechnology, NANO 2011 ; Conference date: 15-08-2011 Through 19-08-2011",

}

Plachinda, P, Rouvimov, S & Solanki, R 2011, Structure analysis of CVD graphene films based on HRTEM contrast simulations. in 2011 11th IEEE International Conference on Nanotechnology, NANO 2011., 6144403, Proceedings of the IEEE Conference on Nanotechnology, pp. 764-769, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011, Portland, OR, United States, 08/15/11. https://doi.org/10.1109/NANO.2011.6144403

Structure analysis of CVD graphene films based on HRTEM contrast simulations. / Plachinda, Paul; Rouvimov, Sergei; Solanki, Raj.
2011 11th IEEE International Conference on Nanotechnology, NANO 2011. 2011. p. 764-769 6144403 (Proceedings of the IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Rouvimov, Sergei

AU - Solanki, Raj

PY - 2011

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N2 - Low-voltage, aberration-corrected, High-Resolution Transmission Electron Microscopy (HRTEM) has proven to be an excellent tool for structure analysis of graphene films, which are typically one or a few atoms thick. Experimental observations of graphene films by HRTEM exhibit several challenges due to low contrast and sensitivity of graphene to intense electron beams. Hence the contrast interpretation requires computer simulations for reliable structure identification. HRTEM contrast simulations of graphene films based on multislice algorithms are presented and compared to experimental results. Stacking sequence, and the number of layers have been analyzed in conjunction with imaging conditions.

AB - Low-voltage, aberration-corrected, High-Resolution Transmission Electron Microscopy (HRTEM) has proven to be an excellent tool for structure analysis of graphene films, which are typically one or a few atoms thick. Experimental observations of graphene films by HRTEM exhibit several challenges due to low contrast and sensitivity of graphene to intense electron beams. Hence the contrast interpretation requires computer simulations for reliable structure identification. HRTEM contrast simulations of graphene films based on multislice algorithms are presented and compared to experimental results. Stacking sequence, and the number of layers have been analyzed in conjunction with imaging conditions.

UR - https://www.scopus.com/pages/publications/84858979492

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DO - 10.1109/NANO.2011.6144403

M3 - Conference contribution

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SN - 9781457715143

T3 - Proceedings of the IEEE Conference on Nanotechnology

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BT - 2011 11th IEEE International Conference on Nanotechnology, NANO 2011

T2 - 2011 11th IEEE International Conference on Nanotechnology, NANO 2011

Y2 - 15 August 2011 through 19 August 2011

ER -

Structure analysis of CVD graphene films based on HRTEM contrast simulations

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