Abstract
Discuss the SiC passive thermometry methods currently performed at INL and ORNL, decide on best path forward for establishing an ASTM Standard for processing SiC temperature monitors, and expand this ASTM benchmarking efforts to international collaborators (Netherlands, Canada, and Poland).
| Original language | English |
|---|---|
| State | Published - 2024 |
| Event | SiC Passive Thermometry Workshop - ORNL, Oak Ridge, United States Duration: May 8 2024 → May 9 2024 |
Workshop
| Workshop | SiC Passive Thermometry Workshop |
|---|---|
| Country/Territory | United States |
| City | Oak Ridge |
| Period | 05/8/24 → 05/9/24 |
Keywords
- 46 - INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
- 36 - MATERIALS SCIENCE
- Silicon Carbide
- Passive Monitors
- Optical Dilatometer
- Resistivity
- NSUF
INL Publication Number
- INL/MIS-24-78380
- 177135
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