Abstract
Nanostructured materials are generally believed to be more radiation resistant. This study reports on Au-ion-induced amorphization in nanocrystalline 3C-SiC, characterized using x-ray diffraction, transmission electron microscopy and Raman spectroscopy. Full amorphization at room temperature occurs at a comparable dose to that for bulk SiC single crystals. The behavior is primarily attributed to a high ion flux and sluggish migration of point defects produced during irradiation. The results may have a significant implication of using nanophased SiC in extremely high radiation environments.
Original language | English |
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Article number | 161301 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 80 |
Issue number | 16 |
DOIs | |
State | Published - Oct 9 2009 |
Externally published | Yes |