Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects

P. Moeck; P. Plachinda; B. Moon; J. Straton; S. Rouvimov; M. Toader; M. Abdel-Hafiez; M. Hietschold

doi:10.1109/ISDRS.2009.5378038

Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects

P. Moeck
, P. Plachinda
, B. Moon
, J. Straton
, S. Rouvimov
, M. Toader
, M. Abdel-Hafiez
, M. Hietschold

Energy & Environmental Science & Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	2009 International Semiconductor Device Research Symposium, ISDRS '09
DOIs	https://doi.org/10.1109/ISDRS.2009.5378038
State	Published - 2009
Event	2009 International Semiconductor Device Research Symposium, ISDRS '09 - College Park, MD, United States Duration: Dec 9 2009 → Dec 11 2009

Publication series

Name	2009 International Semiconductor Device Research Symposium, ISDRS '09

Conference

Conference	2009 International Semiconductor Device Research Symposium, ISDRS '09
Country/Territory	United States
City	College Park, MD
Period	12/9/09 → 12/11/09

Access to Document

10.1109/ISDRS.2009.5378038

Cite this

Moeck, P., Plachinda, P., Moon, B., Straton, J., Rouvimov, S., Toader, M., Abdel-Hafiez, M., & Hietschold, M. (2009). Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects. In 2009 International Semiconductor Device Research Symposium, ISDRS '09 Article 5378038 (2009 International Semiconductor Device Research Symposium, ISDRS '09). https://doi.org/10.1109/ISDRS.2009.5378038

@inproceedings{9fa5f22ec2a7409b890ab20ef6e11c04,

title = "Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects",

author = "P. Moeck and P. Plachinda and B. Moon and J. Straton and S. Rouvimov and M. Toader and M. Abdel-Hafiez and M. Hietschold",

year = "2009",

doi = "10.1109/ISDRS.2009.5378038",

language = "English",

isbn = "9781424460304",

series = "2009 International Semiconductor Device Research Symposium, ISDRS '09",

booktitle = "2009 International Semiconductor Device Research Symposium, ISDRS '09",

note = "2009 International Semiconductor Device Research Symposium, ISDRS '09 ; Conference date: 09-12-2009 Through 11-12-2009",

}

Moeck, P, Plachinda, P, Moon, B, Straton, J, Rouvimov, S, Toader, M, Abdel-Hafiez, M & Hietschold, M 2009, Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects. in 2009 International Semiconductor Device Research Symposium, ISDRS '09., 5378038, 2009 International Semiconductor Device Research Symposium, ISDRS '09, 2009 International Semiconductor Device Research Symposium, ISDRS '09, College Park, MD, United States, 12/9/09. https://doi.org/10.1109/ISDRS.2009.5378038

Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects. / Moeck, P.; Plachinda, P.; Moon, B. et al.
2009 International Semiconductor Device Research Symposium, ISDRS '09. 2009. 5378038 (2009 International Semiconductor Device Research Symposium, ISDRS '09).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects

AU - Moeck, P.

AU - Plachinda, P.

AU - Moon, B.

AU - Straton, J.

AU - Rouvimov, S.

AU - Toader, M.

AU - Abdel-Hafiez, M.

AU - Hietschold, M.

PY - 2009

Y1 - 2009

UR - https://www.scopus.com/pages/publications/77949353306

U2 - 10.1109/ISDRS.2009.5378038

DO - 10.1109/ISDRS.2009.5378038

M3 - Conference contribution

AN - SCOPUS:77949353306

SN - 9781424460304

T3 - 2009 International Semiconductor Device Research Symposium, ISDRS '09

BT - 2009 International Semiconductor Device Research Symposium, ISDRS '09

T2 - 2009 International Semiconductor Device Research Symposium, ISDRS '09

Y2 - 9 December 2009 through 11 December 2009

ER -

Moeck P, Plachinda P, Moon B, Straton J, Rouvimov S, Toader M et al. Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects. In 2009 International Semiconductor Device Research Symposium, ISDRS '09. 2009. 5378038. (2009 International Semiconductor Device Research Symposium, ISDRS '09). doi: 10.1109/ISDRS.2009.5378038

Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects

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