Photothermal reflectance technique to measure thermal conductivity with micrometer resolution

Zilong Hua, Heng Ban, Marat Khafizov, Robert Schley, David Hurley, Rory Kennedy

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	319-320
Number of pages	2
Journal	Transactions of the American Nuclear Society
Volume	108
State	Published - 2013
Event	2013 ANS Annual Meeting - Next Generation Nuclear Energy: Prospects and Challenges - Atlanta, GA, United States Duration: Jun 16 2013 → Jun 20 2013

Cite this

@article{a504f7c5f3d54b92b9309dd10adf8758,

title = "Photothermal reflectance technique to measure thermal conductivity with micrometer resolution",

author = "Zilong Hua and Heng Ban and Marat Khafizov and Robert Schley and David Hurley and Rory Kennedy",

year = "2013",

language = "English",

volume = "108",

pages = "319--320",

journal = "Transactions of the American Nuclear Society",

issn = "0003-018X",

publisher = "American Nuclear Society",

note = "2013 ANS Annual Meeting - Next Generation Nuclear Energy: Prospects and Challenges ; Conference date: 16-06-2013 Through 20-06-2013",

}

TY - JOUR

T1 - Photothermal reflectance technique to measure thermal conductivity with micrometer resolution

AU - Hua, Zilong

AU - Ban, Heng

AU - Khafizov, Marat

AU - Schley, Robert

AU - Hurley, David

AU - Kennedy, Rory

PY - 2013

Y1 - 2013

UR - http://www.scopus.com/inward/record.url?scp=84902465534&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:84902465534

SN - 0003-018X

VL - 108

SP - 319

EP - 320

JO - Transactions of the American Nuclear Society

JF - Transactions of the American Nuclear Society

T2 - 2013 ANS Annual Meeting - Next Generation Nuclear Energy: Prospects and Challenges

Y2 - 16 June 2013 through 20 June 2013

ER -