Oxidation of Cr xO yH z - in an ion trap secondary ion mass spectrometer

Anita K. Gianotto; Brittany D.M. Hodges; Anthony D. Appelhans; Michael T. Benson; Peter B. Harrington; Gary S. Groenewold

Oxidation of Cr _xO _yH _z ^- in an ion trap secondary ion mass spectrometer

Anita K. Gianotto
, Brittany D.M. Hodges
, Anthony D. Appelhans
, Michael T. Benson
, Peter B. Harrington
, Gary S. Groenewold

Research output: Contribution to conference › Paper › peer-review

Abstract

The polyatomic projectile for oxidation of Cr _xO _yH _z with an ion trap (IT) secondary ion mass spectrometer (SIMS) was analyzed. For the experiments chromium oxyanions were formed via sputter desorption with 5 keV ReO ₄, and oxyanions were mass isolated in the trap using a notched filtered noise field and then reacted with O ₂ at ∼1 × 10 ^-6 torr. It was found that vibrationally activated Cr _xO _y produces smaller oxyanions by fragmentation. The result states that the bombardment of a dichromate salt in an IT-SIMS generates chromium oxyanions.

Original language	English
Pages	769-770
Number of pages	2
State	Published - 2002
Event	Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics - Orlando, FL, United States Duration: Jun 2 2002 → Jun 6 2002

Conference

Conference	Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics
Country/Territory	United States
City	Orlando, FL
Period	06/2/02 → 06/6/02

Cite this

@conference{728e9c8424064e26a21cf153da60b3f1,

title = "Oxidation of Cr xO yH z - in an ion trap secondary ion mass spectrometer",

abstract = "The polyatomic projectile for oxidation of Cr xO yH z with an ion trap (IT) secondary ion mass spectrometer (SIMS) was analyzed. For the experiments chromium oxyanions were formed via sputter desorption with 5 keV ReO 4, and oxyanions were mass isolated in the trap using a notched filtered noise field and then reacted with O 2 at ∼1 × 10 -6 torr. It was found that vibrationally activated Cr xO y produces smaller oxyanions by fragmentation. The result states that the bombardment of a dichromate salt in an IT-SIMS generates chromium oxyanions.",

author = "Gianotto, \{Anita K.\} and Hodges, \{Brittany D.M.\} and Appelhans, \{Anthony D.\} and Benson, \{Michael T.\} and Harrington, \{Peter B.\} and Groenewold, \{Gary S.\}",

year = "2002",

language = "English",

pages = "769--770",

note = "Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics ; Conference date: 02-06-2002 Through 06-06-2002",

}

TY - CONF

T1 - Oxidation of Cr xO yH z - in an ion trap secondary ion mass spectrometer

AU - Gianotto, Anita K.

AU - Hodges, Brittany D.M.

AU - Appelhans, Anthony D.

AU - Benson, Michael T.

AU - Harrington, Peter B.

AU - Groenewold, Gary S.

PY - 2002

Y1 - 2002

N2 - The polyatomic projectile for oxidation of Cr xO yH z with an ion trap (IT) secondary ion mass spectrometer (SIMS) was analyzed. For the experiments chromium oxyanions were formed via sputter desorption with 5 keV ReO 4, and oxyanions were mass isolated in the trap using a notched filtered noise field and then reacted with O 2 at ∼1 × 10 -6 torr. It was found that vibrationally activated Cr xO y produces smaller oxyanions by fragmentation. The result states that the bombardment of a dichromate salt in an IT-SIMS generates chromium oxyanions.

AB - The polyatomic projectile for oxidation of Cr xO yH z with an ion trap (IT) secondary ion mass spectrometer (SIMS) was analyzed. For the experiments chromium oxyanions were formed via sputter desorption with 5 keV ReO 4, and oxyanions were mass isolated in the trap using a notched filtered noise field and then reacted with O 2 at ∼1 × 10 -6 torr. It was found that vibrationally activated Cr xO y produces smaller oxyanions by fragmentation. The result states that the bombardment of a dichromate salt in an IT-SIMS generates chromium oxyanions.

UR - https://www.scopus.com/pages/publications/84862369754

M3 - Paper

AN - SCOPUS:84862369754

SP - 769

EP - 770

T2 - Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics

Y2 - 2 June 2002 through 6 June 2002

ER -

Oxidation of Cr _xO _yH _z ^- in an ion trap secondary ion mass spectrometer

Abstract

Conference

Other files and links

Fingerprint

Cite this