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On the use of SiC for peak irradiation temperature measurement

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Silicon carbide (SiC) monitors provide a means of measuring peak irradiation temperature of static capsules in nuclear irradiation experiments. Neutron irradiation of a SiC monitor causes permanent lattice changes that are removed by annealing to a temperature that exceeds the peak irradiation temperature. The annealing process results in changes to SiC physical characteristics that can be observed during the annealing process. This paper presents preliminary results of a method aimed at using electrical resistance, measured during a two-pass heating - cooling cycle as a means of recovering the irradiation temperature of a SiC monitor. Results indicate that the relationship between resistance and temperature of a SiC monitor shows a significant change in slope when the peak irradiation temperature is reached. This demonstrates the potential for this method to replace the current manual, and lengthy, process of post irradiation examination used to extract the peak irradiation temperature from irradiated SiC monitors.

Original languageEnglish
Title of host publication11th Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2019
PublisherAmerican Nuclear Society
Pages1319-1323
Number of pages5
ISBN (Electronic)9780894487835
StatePublished - 2019
Event11th Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2019 - Orlando, United States
Duration: Feb 9 2019Feb 14 2019

Publication series

Name11th Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2019

Conference

Conference11th Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2019
Country/TerritoryUnited States
CityOrlando
Period02/9/1902/14/19

Keywords

  • Irradiation experiments
  • Post irradiation examination
  • SiC monitors

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