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Micro-four-line probe to measure electronic conductivity and contact resistance of thin-film battery electrodes
Bryson J. Lanterman, Adriaan A. Riet, Nathaniel S. Gates, Joshua D. Flygare, Andrew D. Cutler, John E. Vogel, Dean R. Wheeler, Brian A. Mazzeo
Research output: Contribution to journal › Article › peer-review
31
Scopus
citations