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Measurements of Surface Contaminants and Sorbed Organics Using an Ion Trap Secondary Ion Mass Spectrometer

  • Gary S. Groenewold
  • , Anthony D. Appelhans
  • , Garold L. Gresham
  • , John E. Olson

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Original languageEnglish
Title of host publicationMass Spectrometry Handbook
PublisherJohn Wiley and Sons
Pages491-507
Number of pages17
ISBN (Print)9780470536735
DOIs
StatePublished - May 21 2012

Keywords

  • Blister agent analysis, IT-SIMS, in hydrolyzed CEES solution to soil
  • IT-SIMS in direct surface, AMPAs, mustard, and IT-SIMS in DSIMS
  • IT-SIMS, and control of surface charging
  • Surface contaminant measure using IT-SIMS

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