Measurement of thermal transport using time-resolved thermal wave microscopy

Marat Khafizov; David H. Hurley

doi:10.1063/1.3653829

Measurement of thermal transport using time-resolved thermal wave microscopy

Marat Khafizov
, David H. Hurley

Materials, Manufacturing, & Bioenergy S&T

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

A theoretical and experimental analysis of a time resolved thermal wave microscopy (TRTWM) technique used for thermal transport measurements is presented. TRTWM utilizes elements of frequency and time domain laser based thermoreflectance techniques and is well suited to measure both lateral and cross plane thermal transport. A primary advantage of this method is that the pump and probe spot sizes do not have to be known accurately. Implementation of TRTWM to measure thermal transport in oxide substrates coated with thin metal films is demonstrated.

Original language	English
Article number	083525
Journal	Journal of Applied Physics
Volume	110
Issue number	8
DOIs	https://doi.org/10.1063/1.3653829
State	Published - Oct 15 2011

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10.1063/1.3653829

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title = "Measurement of thermal transport using time-resolved thermal wave microscopy",

abstract = "A theoretical and experimental analysis of a time resolved thermal wave microscopy (TRTWM) technique used for thermal transport measurements is presented. TRTWM utilizes elements of frequency and time domain laser based thermoreflectance techniques and is well suited to measure both lateral and cross plane thermal transport. A primary advantage of this method is that the pump and probe spot sizes do not have to be known accurately. Implementation of TRTWM to measure thermal transport in oxide substrates coated with thin metal films is demonstrated.",

author = "Marat Khafizov and Hurley, \{David H.\}",

note = "Funding Information: This material is based upon work supported as part of the Center for Materials Science of Nuclear Fuel, an Energy Frontier Research Center funded by the U.S. Department of Energy (DOE), Office of Science, Office of Basic Energy Sciences under Award Number FWP 1356. ",

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AB - A theoretical and experimental analysis of a time resolved thermal wave microscopy (TRTWM) technique used for thermal transport measurements is presented. TRTWM utilizes elements of frequency and time domain laser based thermoreflectance techniques and is well suited to measure both lateral and cross plane thermal transport. A primary advantage of this method is that the pump and probe spot sizes do not have to be known accurately. Implementation of TRTWM to measure thermal transport in oxide substrates coated with thin metal films is demonstrated.

UR - https://www.scopus.com/pages/publications/80655128705

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Measurement of thermal transport using time-resolved thermal wave microscopy

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