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Improved low power, modular thermal neutron counter based on microstructured semiconductor neutron detectors (MSND)

  • Ryan G. Fronk
  • , Steven L. Bellinger
  • , Luke C. Henson
  • , David E. Huddleston
  • , Taylor R. Ochs
  • , Timothy J. Sobering
  • , Douglas S. McGregor

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

AmoAyAzr , mass-producible, low-power, compact thermal-neutron counter has been developed to meet the needs for modern detector instruments and to compete with aging 3He-based counter systems. The Domino V5.4 neutron detector package is populated with four 1-cm2 active-area microstructured semiconductor neutron detectors (MSNDs). The detectors are calibrated to an intrinsic thermal neutron detection efficiency of 30% over its 4 cm2 active area. A gamma-ray rejection ratio of at least 1:108 is achieved at this calibration level. Total device dimensions measure 2.5-cm wide by 3.8-cm tall and 0.47-cm thick, weighing 9.5 g. Individual Dominoes can be tiled together into strings and then arrayed laterally to form large-area instruments. In this form, the small sensor can populate instruments up to 1 m2, with a cost that is comparable to a similar 3He-based array. The addition of I2C-based bias and threshold controllers reduces sensor cost and complexity over the previously-reported Domino versions (V3.0 and V4.0) and allows for user-end calibrations and modifications. Furthermore, the Domino has realized lOx reduced power consumption over previous versions, to nearly 90uW at 3.3 volts, while also reducing sensitivity to thermal- and capacitance-induced noise from the MSNDs, making the Domino an ideal candidate for 3He replacement and implementation in low-power, portable neutron-detector instruments.

Original languageEnglish
Title of host publication2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509016426
DOIs
StatePublished - Oct 16 2017
Event2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
Duration: Oct 29 2016Nov 6 2016

Publication series

Name2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume2017-January

Conference

Conference2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Country/TerritoryFrance
CityStrasbourg
Period10/29/1611/6/16

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