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High-resolution alpha-particle spectrometry using 4H silicon carbide semiconductor detectors

  • Frank H. Ruddy
  • , John G. Seidel
  • , Haoqian Chen
  • , Abdul R. Dulloo
  • , Sei-Hyung Ryu

Research output: Contribution to journalArticlepeer-review

107 Scopus citations

Abstract

SiC detectors with active volume dimensions sufficient to stop alpha particles have been manufactured and tested. A linear energy response and excellent energy resolution have been obtained for various alpha emitters in the 3.18-MeV to 8.38-MeV energy range. Evaluation of the contributing factors to the SiC detector energy resolution indicates that the measured values for the full width at half maximum (FWHM) are limited by energy straggling of the alpha particles as they pass through the metallic contact layers that comprise the entrance window to the detector. Even with this component included in the measured FWHM, the measured values are comparable to those achievable with silicon alpha spectrometers. The possibility that the energy resolution that can be achieved with SiC may surpass that of silicon can not be excluded. SiC alpha spectrometers are expected to be useful in many nuclear applications where the ability to operate in high-temperature and high-radiation environments is required. Such applications include monitoring of alpha particles, neutrons, and low-energy gamma rays and X-rays in actinide waste-tank environments as well as neutron and gamma-ray monitoring of spent nuclear fuel assemblies. © 2006 IEEE.
Original languageEnglish
Pages (from-to)1713 – 1718
JournalIEEE Transactions on Nuclear Science
Volume53
Issue number3
Early online dateJun 30 2006
DOIs
StatePublished - Jun 30 2006
Externally publishedYes

Keywords

  • Actinides
  • Gamma rays
  • Optical resolving power
  • Semiconductor materials
  • Silicon carbide
  • Spectrometers
  • Spectroscopic analysis
  • High-radiation environments
  • Metallic contact layers
  • Nuclear applications
  • Silicon alpha spectrometers
  • Radiation detectors

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