Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement

Tianyu Wang; Shen Xu; David H. Hurley; Yanan Yue; Xinwei Wang

doi:10.1364/OL.41.000080

Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement

Tianyu Wang
, Shen Xu
, David H. Hurley
, Yanan Yue
, Xinwei Wang

Materials, Manufacturing, & Bioenergy S&T

Research output: Contribution to journal › Article › peer-review

50 Scopus citations

Abstract

A new transient Raman thermal probing technique, frequency-resolved Raman (FR-Raman), is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude-modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are reconstructed and used for fitting to determine the thermal diffusivity. A microscale silicon (Si) cantilever is used to investigate the capacity of this new technique. The thermal diffusivity is determined as 9.57 × 10^-5 m²/s, 11.00 × 10^-5 m²/s, and 9.02 × 10^-5 m²/s via fitting Raman intensity, wavenumber, and total Raman emission, respectively. The results agree well with literature data. The FR-Raman provides a novel way for transient thermal probing with very high temporal resolution and micrometer-scale spatial resolution.

Original language	English
Pages (from-to)	80-83
Number of pages	4
Journal	Optics Letters
Volume	41
Issue number	1
DOIs	https://doi.org/10.1364/OL.41.000080
State	Published - Jan 1 2016

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@article{c2fa7430073d4d98a7394d9fb3432255,

title = "Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement",

abstract = "A new transient Raman thermal probing technique, frequency-resolved Raman (FR-Raman), is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude-modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are reconstructed and used for fitting to determine the thermal diffusivity. A microscale silicon (Si) cantilever is used to investigate the capacity of this new technique. The thermal diffusivity is determined as 9.57 × 10-5 m2/s, 11.00 × 10-5 m2/s, and 9.02 × 10-5 m2/s via fitting Raman intensity, wavenumber, and total Raman emission, respectively. The results agree well with literature data. The FR-Raman provides a novel way for transient thermal probing with very high temporal resolution and micrometer-scale spatial resolution.",

author = "Tianyu Wang and Shen Xu and Hurley, \{David H.\} and Yanan Yue and Xinwei Wang",

note = "Publisher Copyright: {\textcopyright} 2015 Optical Society of America.",

year = "2016",

month = jan,

day = "1",

doi = "10.1364/OL.41.000080",

language = "English",

volume = "41",

pages = "80--83",

journal = "Optics Letters",

issn = "0146-9592",

publisher = "Optica Publishing Group (formerly OSA)",

number = "1",

}

TY - JOUR

T1 - Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement

AU - Wang, Tianyu

AU - Xu, Shen

AU - Hurley, David H.

AU - Yue, Yanan

AU - Wang, Xinwei

PY - 2016/1/1

Y1 - 2016/1/1

N2 - A new transient Raman thermal probing technique, frequency-resolved Raman (FR-Raman), is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude-modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are reconstructed and used for fitting to determine the thermal diffusivity. A microscale silicon (Si) cantilever is used to investigate the capacity of this new technique. The thermal diffusivity is determined as 9.57 × 10-5 m2/s, 11.00 × 10-5 m2/s, and 9.02 × 10-5 m2/s via fitting Raman intensity, wavenumber, and total Raman emission, respectively. The results agree well with literature data. The FR-Raman provides a novel way for transient thermal probing with very high temporal resolution and micrometer-scale spatial resolution.

AB - A new transient Raman thermal probing technique, frequency-resolved Raman (FR-Raman), is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude-modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are reconstructed and used for fitting to determine the thermal diffusivity. A microscale silicon (Si) cantilever is used to investigate the capacity of this new technique. The thermal diffusivity is determined as 9.57 × 10-5 m2/s, 11.00 × 10-5 m2/s, and 9.02 × 10-5 m2/s via fitting Raman intensity, wavenumber, and total Raman emission, respectively. The results agree well with literature data. The FR-Raman provides a novel way for transient thermal probing with very high temporal resolution and micrometer-scale spatial resolution.

UR - https://www.scopus.com/pages/publications/84993990201

U2 - 10.1364/OL.41.000080

DO - 10.1364/OL.41.000080

M3 - Article

AN - SCOPUS:84993990201

SN - 0146-9592

VL - 41

SP - 80

EP - 83

JO - Optics Letters

JF - Optics Letters

IS - 1

ER -

Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement

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