TY - JOUR
T1 - Frequency-resolved Raman for transient thermal probing and thermal diffusivity measurement
AU - Wang, Tianyu
AU - Xu, Shen
AU - Hurley, David H.
AU - Yue, Yanan
AU - Wang, Xinwei
N1 - Publisher Copyright:
© 2015 Optical Society of America.
PY - 2016/1/1
Y1 - 2016/1/1
N2 - A new transient Raman thermal probing technique, frequency-resolved Raman (FR-Raman), is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude-modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are reconstructed and used for fitting to determine the thermal diffusivity. A microscale silicon (Si) cantilever is used to investigate the capacity of this new technique. The thermal diffusivity is determined as 9.57 × 10-5 m2/s, 11.00 × 10-5 m2/s, and 9.02 × 10-5 m2/s via fitting Raman intensity, wavenumber, and total Raman emission, respectively. The results agree well with literature data. The FR-Raman provides a novel way for transient thermal probing with very high temporal resolution and micrometer-scale spatial resolution.
AB - A new transient Raman thermal probing technique, frequency-resolved Raman (FR-Raman), is developed for probing the transient thermal response of materials and measuring their thermal diffusivity. The FR-Raman uses an amplitude-modulated square-wave laser for simultaneous material heating and Raman excitation. The evolution profile of Raman properties: intensity, Raman wavenumber, and emission, against frequency are reconstructed and used for fitting to determine the thermal diffusivity. A microscale silicon (Si) cantilever is used to investigate the capacity of this new technique. The thermal diffusivity is determined as 9.57 × 10-5 m2/s, 11.00 × 10-5 m2/s, and 9.02 × 10-5 m2/s via fitting Raman intensity, wavenumber, and total Raman emission, respectively. The results agree well with literature data. The FR-Raman provides a novel way for transient thermal probing with very high temporal resolution and micrometer-scale spatial resolution.
UR - http://www.scopus.com/inward/record.url?scp=84993990201&partnerID=8YFLogxK
U2 - 10.1364/OL.41.000080
DO - 10.1364/OL.41.000080
M3 - Article
AN - SCOPUS:84993990201
SN - 0146-9592
VL - 41
SP - 80
EP - 83
JO - Optics Letters
JF - Optics Letters
IS - 1
ER -