Focused Ion Beam (FIB) microscopy of oxide dispersion strengthened molybdenum

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Original language	English
Pages (from-to)	1114-1115
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604882254
State	Published - 2004

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@article{a4298d37ff6847e889ec6e810985893b,

title = "Focused Ion Beam (FIB) microscopy of oxide dispersion strengthened molybdenum",

author = "R. Baranwal and Burke, \{M. G.\} and Phaneuf, \{M. W.\}",

year = "2004",

doi = "10.1017/S1431927604882254",

language = "English",

volume = "10",

pages = "1114--1115",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Focused Ion Beam (FIB) microscopy of oxide dispersion strengthened molybdenum

AU - Baranwal, R.

AU - Burke, M. G.

AU - Phaneuf, M. W.

PY - 2004

Y1 - 2004

UR - https://www.scopus.com/pages/publications/4544361126

U2 - 10.1017/S1431927604882254

DO - 10.1017/S1431927604882254

M3 - Article

AN - SCOPUS:4544361126

SN - 1431-9276

VL - 10

SP - 1114

EP - 1115

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -