Original language | English |
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Pages (from-to) | 1114-1115 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 10 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - 2004 |
Externally published | Yes |
Focused Ion Beam (FIB) microscopy of oxide dispersion strengthened molybdenum
R. Baranwal, M. G. Burke, M. W. Phaneuf
Research output: Contribution to journal › Article › peer-review