Focused Ion Beam (FIB) microscopy of oxide dispersion strengthened molybdenum

R. Baranwal, M. G. Burke, M. W. Phaneuf

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1114-1115
Number of pages2
JournalMicroscopy and Microanalysis
Volume10
Issue numberSUPPL. 2
DOIs
StatePublished - 2004
Externally publishedYes

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