@inproceedings{4d6348fdc33740f891da05529b35021b,
title = "Far-infrared reflection absorption spectroscopy: Low frequency studies on single-crystal oxide surfaces",
abstract = "Synchrotron-based Far-IR Reflection Absorption Spectroscopy (Far-IRAS) is ideal for investigating low energy dynamics at surfaces. In particular, bonding modes between an adsorbate and substrate typically lie below 1000 cm{"}1 and are more sensitive to the local geometrical and electronic structures. A bright synchrotron source affords the ability to investigate these low frequency modes at high resolution for restrictive experimental (throughputs) geometries. Furthermore, a grazing incidence geometry with a limited throughput is necessary to gain information about the bonds at the adsorbate/substrate interface especially for substrates that absorb infrared light. This technique, proven in studies of adsorbate/metal interfaces, is extended to study the interface between adsorbates and oxide substrates. Two approaches to this class of experiments will be introduced and the intrinsic noise limitations of each will be discussed.",
author = "M. Pilling and T. He and C. Hirschmugl",
note = "Publisher Copyright: {\textcopyright} 2000 American Institute of Physics Inc.. All rights reserved.; 11th US National Conference on Synchrotron Radiation Instrumentation, SRI 1999 ; Conference date: 13-10-1999 Through 15-10-1999",
year = "2000",
month = jun,
day = "6",
doi = "10.1063/1.1291756",
language = "English",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
pages = "41--46",
editor = "Piero Pianetta and John Arthur and Sean Brennan",
booktitle = "Synchrotron Radiation Instrumentation, SRI 1999 - 11th US National Conference",
}