TY - GEN
T1 - Evaluation of uncertainties of one-directional analytical model for thermoreflectance technique
AU - Xing, Changhu
AU - Hua, Zilong
AU - Ban, Heng
AU - Hurley, David
AU - Kennedy, J. Rory
PY - 2011
Y1 - 2011
N2 - One dimensional(1-D) analytical models are generally used for the evaluation of thermal effusivity of film or substrate in thermoreflectance measurement. However, the range of uncertainties associated with the 1-D assumptions needs to be quantified in order to determine the applicability of 1-D models. In the current study, a two-dimensional (2-D) numerical model was created in a commercial software package, COMSOL, to investigate the difference of results obtained by 1-D or 2-D models. The analysis used a frequency lock-in strategy and the result was verified by a comparison of 1-D numerical simulation to 1-D theoretical values. Parametric studies were performed by considering film thickness, heating laser radius, volumetric heating, thermal resistance between layers, and anisotropic thermal conductivities. The results and conclusions provide a general guidance and reference for the parametric design of thermoreflectance measurements.
AB - One dimensional(1-D) analytical models are generally used for the evaluation of thermal effusivity of film or substrate in thermoreflectance measurement. However, the range of uncertainties associated with the 1-D assumptions needs to be quantified in order to determine the applicability of 1-D models. In the current study, a two-dimensional (2-D) numerical model was created in a commercial software package, COMSOL, to investigate the difference of results obtained by 1-D or 2-D models. The analysis used a frequency lock-in strategy and the result was verified by a comparison of 1-D numerical simulation to 1-D theoretical values. Parametric studies were performed by considering film thickness, heating laser radius, volumetric heating, thermal resistance between layers, and anisotropic thermal conductivities. The results and conclusions provide a general guidance and reference for the parametric design of thermoreflectance measurements.
UR - http://www.scopus.com/inward/record.url?scp=85087246768&partnerID=8YFLogxK
U2 - 10.1115/ajtec2011-44539
DO - 10.1115/ajtec2011-44539
M3 - Conference contribution
AN - SCOPUS:85087246768
SN - 9780791838921
T3 - ASME/JSME 2011 8th Thermal Engineering Joint Conference, AJTEC 2011
BT - ASME/JSME 2011 8th Thermal Engineering Joint Conference, AJTEC 2011
PB - American Society of Mechanical Engineers
T2 - ASME/JSME 2011 8th Thermal Engineering Joint Conference, AJTEC 2011
Y2 - 13 March 2011 through 17 March 2011
ER -