Digital Infrastructure Loop Integrated Test Environment for Evaluating Safety-Related Plant Instrumentation and Control System Performance and Reliability

Edward Chen; Jisuk Kim; Tate Shorthill; Jeffrey Joe; Aaron Green; Damian Mirizio; Steven Anthony; Stephen Middlekauff

doi:10.13182/T134-10932

Digital Infrastructure Loop Integrated Test Environment for Evaluating Safety-Related Plant Instrumentation and Control System Performance and Reliability

Edward Chen
, Jisuk Kim
, Tate Shorthill
, Jeffrey Joe
, Aaron Green
, Damian Mirizio
, Steven Anthony
, Stephen Middlekauff

Nuclear Safety & Regulatory Research

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	162
Number of pages	1
Journal	Transactions of the American Nuclear Society
Volume	134
Early online date	Jun 2026
DOIs	https://doi.org/10.13182/T134-10932
State	Published - 2026
Event	ANS Annual Conference, 2026 - Denver, United States Duration: May 31 2026 → Jun 3 2026

INL Publication Number

INL/CON-26-89958
211957

Access to Document

10.13182/T134-10932

Cite this

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title = "Digital Infrastructure Loop Integrated Test Environment for Evaluating Safety-Related Plant Instrumentation and Control System Performance and Reliability",

author = "Edward Chen and Jisuk Kim and Tate Shorthill and Jeffrey Joe and Aaron Green and Damian Mirizio and Steven Anthony and Stephen Middlekauff",

year = "2026",

doi = "10.13182/T134-10932",

language = "English",

volume = "134",

pages = "162",

journal = "Transactions of the American Nuclear Society",

issn = "0003-018X",

publisher = "American Nuclear Society",

note = "ANS Annual Conference, 2026 ; Conference date: 31-05-2026 Through 03-06-2026",

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TY - JOUR

T1 - Digital Infrastructure Loop Integrated Test Environment for Evaluating Safety-Related Plant Instrumentation and Control System Performance and Reliability

AU - Chen, Edward

AU - Kim, Jisuk

AU - Shorthill, Tate

AU - Joe, Jeffrey

AU - Green, Aaron

AU - Mirizio, Damian

AU - Anthony, Steven

AU - Middlekauff, Stephen

PY - 2026

Y1 - 2026

UR - https://www.scopus.com/pages/publications/105046054330

U2 - 10.13182/T134-10932

DO - 10.13182/T134-10932

M3 - Conference article

AN - SCOPUS:105046054330

SN - 0003-018X

VL - 134

SP - 162

JO - Transactions of the American Nuclear Society

JF - Transactions of the American Nuclear Society

T2 - ANS Annual Conference, 2026

Y2 - 31 May 2026 through 3 June 2026

ER -

Digital Infrastructure Loop Integrated Test Environment for Evaluating Safety-Related Plant Instrumentation and Control System Performance and Reliability

INL Publication Number

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