Skip to main navigation Skip to search Skip to main content

Detection Impact of Synthetic Defective Wafer Map Images Generated by Enhanced-CycleGAN

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Detection Impact of Synthetic Defective Wafer Map Images Generated by Enhanced-CycleGAN'. Together they form a unique fingerprint.
Sort by

Engineering

Chemical Engineering

Earth and Planetary Sciences

Keyphrases

Biochemistry, Genetics and Molecular Biology