TY - GEN
T1 - Data-Driven Suitability Analysis to Enable Machine Learning Explainability and Security
AU - Wolf, Shaya
AU - Foster, Rita
AU - Haile, Jed
AU - Borowczak, Mike
AU - Wolf, Shaya
AU - Haile, Jed
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021/11/24
Y1 - 2021/11/24
N2 - This work posits that suitability analyses that pair machine learning best practices with domain knowledge mapped to statistically significant metrics can determine boundaries for responsible data usage in machine learning models. A suitability analysis was described and tested for a malware analysis model called @DisCo and was tested across three datasets. This analysis predicted @DisCo's ability to correctly dissect data and come to reasonable conclusions. The suitability analysis correctly identified the acceptability of each dataset based on the structure of the data alongside knowledge of how @DisCo was trained and underlying domain knowledge. This process is repeatable and automate-Able such that data that is not fit for @DisCo can be blocked and inaccurate results would be replaced with an explanation of why data is not fit for the model.1
AB - This work posits that suitability analyses that pair machine learning best practices with domain knowledge mapped to statistically significant metrics can determine boundaries for responsible data usage in machine learning models. A suitability analysis was described and tested for a malware analysis model called @DisCo and was tested across three datasets. This analysis predicted @DisCo's ability to correctly dissect data and come to reasonable conclusions. The suitability analysis correctly identified the acceptability of each dataset based on the structure of the data alongside knowledge of how @DisCo was trained and underlying domain knowledge. This process is repeatable and automate-Able such that data that is not fit for @DisCo can be blocked and inaccurate results would be replaced with an explanation of why data is not fit for the model.1
UR - https://www.scopus.com/pages/publications/85123300623
U2 - 10.1109/RWS52686.2021.9611792
DO - 10.1109/RWS52686.2021.9611792
M3 - Conference contribution
AN - SCOPUS:85123300623
SN - 9781665429054
T3 - 2021 Resilience Week, RWS 2021 - Proceedings
BT - 2021 Resilience Week, RWS 2021 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 Resilience Week, RWS 2021
Y2 - 18 October 2021 through 21 October 2021
ER -