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Damage production in silicon carbide by dual ion beams irradiation
Xu Wang
, Yanwen Zhang
, Dong Han
, Yunbiao Zhao
, Ziqiang Zhao
, Ming Zhang
Research output
:
Contribution to journal
›
Article
›
peer-review
16
Scopus citations
Overview
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Dive into the research topics of 'Damage production in silicon carbide by dual ion beams irradiation'. Together they form a unique fingerprint.
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Keyphrases
Silicon Carbide
100%
Damage Production
100%
Dual Ion Beam Irradiation
100%
Damage Level
66%
Mechanical Properties
33%
Raman Spectroscopy
33%
Ion Irradiation
33%
Defect Evolution
33%
Covalent Bond
33%
He Ion Irradiation
33%
Nanoindentation Test
33%
He Atom
33%
Irradiated Sample
33%
He Ion Implantation
33%
Defect Type
33%
6H-SiC
33%
Nanohardness
33%
Raman Spectra
33%
Single-crystalline
33%
Defect Interaction
33%
Damage State
33%
Complex Defects
33%
Hardening Effect
33%
High-resolution X-ray Diffraction (HRXRD)
33%
Irradiation Process
33%
Si Ions
33%
Strain Profile
33%
Dual Ion Irradiation
33%
Si Ion Implantation
33%
Lattice Damage
33%
Lattice Evolution
33%
Normal Strain
33%
Chemical Bonding States
33%
Engineering
Beam Irradiation
100%
Damage Level
66%
High Resolution
33%
Covalent
33%
Ion Implantation
33%
Related Defect
33%
Nanohardness
33%
Raman Spectra
33%
Damage State
33%
Hardening Effect
33%
Strain Profile
33%
Normal Strain
33%
Nanoindentation Test
33%
X Ray Diffraction
33%
Material Science
Silicon Carbide
100%
Ion Bombardment
100%
Indentation Hardness Testing
33%
Raman Spectroscopy
33%
Covalent Bond
33%
Ion Implantation
33%
Nanoindentation
33%
Nanohardness
33%
Chemical Bonding
33%
High Resolution X-Ray Diffraction
33%