Abstract
Damage accumulation in Sm2Ti2O7 single crystals irradiated with Au2+ ions at 170, 300 and 700 K was studied by Rutherford backscattering spectrometry using a 2.0 MeV He+ beam along the 〈001〉 channeling direction. The relative disorder on the Sm sublattice follows a nonlinear dependence on ion fluence. The nonlinear behavior is described well by a disorder accumulation model that indicates a predominant role of a defect-stimulated amorphization process. The critical dose for amorphization at 300 K is ∼0.14 dpa, which is in good agreement with in situ transmission electron microscopy results for polycrystalline Sm 2Ti2O7 irradiated with 600 keV Bi+ ions and with Gd2Ti2O7 doped with 244Cm. Despite the six orders of magnitude difference in damage rates, the good agreement between the amorphization doses in Sm 2Ti2O7 at 300 K and 244Cm-doped Gd2Ti2O7 at 340 K indicates that damage accumulation at these temperatures is relatively independent of dose rate.
| Original language | English |
|---|---|
| Pages (from-to) | 89-94 |
| Number of pages | 6 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 218 |
| Issue number | 1-4 |
| DOIs | |
| State | Published - Jun 2004 |
| Externally published | Yes |
| Event | Proceedings of the Twelfth International Conference on Radiation - Gramado, Brazil Duration: Aug 31 2003 → Sep 5 2003 |
Keywords
- Amorphization
- Damage accumulation
- Irradiation
- Rutherford backscattering spectroscopy
- Samarium titanate pyrochlore
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