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Coupled electronic and atomic effects on defect evolution in silicon carbide under ion irradiation

  • Yanwen Zhang
  • , Haizhou Xue
  • , Eva Zarkadoula
  • , Ritesh Sachan
  • , Christopher Ostrouchov
  • , Peng Liu
  • , Xue lin Wang
  • , Shuo Zhang
  • , Tie Shan Wang
  • , William J. Weber

Research output: Contribution to journal › Article › peer-review

77 Scopus citations

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