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Characterizing Macroscopic Thermal Resistance Across Contacting Interfaces Through Local Understanding of Thermal Transport

  • Seshu Nimmala
  • , S. Aria Hosseini
  • , Jackson Harter
  • , Todd Palmer
  • , Eric Lenz
  • , P. Alex Greaney

Research output: Contribution to journalArticlepeer-review

Abstract

Thermal resistance across the interface between touching surfaces is critical for many industrial applications. We developed a network model to predict the macroscopic thermal resistance of mechanically contacting surfaces. Contacting interfaces are fractally rough, with small islands of locally intimate contact separated by regions with a wider gas filled boundary gap. Heat flow across the interface is therefore heterogeneous and thus the contact model is based on a network of thermal resistors representing boundary resistance at local contacts and the access resistance for lateral transport to contacts. Molecular dynamics simulations have been performed to characterize boundary resistance of Silicon Alumina interfaces for testing the sensitivity of thermal resistance to contact opening. Boltzmann transport simulations of access resistance in Si are conducted in the ballistic transport regime.

Original languageEnglish
Pages (from-to)2735-2741
Number of pages7
JournalMRS Advances
Volume3
Issue number44
DOIs
StatePublished - 2018

Keywords

  • interface
  • modeling
  • simulation
  • thermal conductivity

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