TY - GEN
T1 - Benchmarking of HEU mental annuli critical assemblies with internally reflected graphite cylinder
AU - Xiaobo, Liu
AU - Bess, John D.
AU - Marshall, Margaret A.
N1 - Publisher Copyright:
© The Authors, published by EDP Sciences, 2017.
PY - 2017/9/13
Y1 - 2017/9/13
N2 - Three experimental configurations of critical assemblies, performed in 1963 at the Oak Ridge Critical Experiment Facility, which are assembled using three different diameter HEU annuli (15-9 inches, 15-7 inches and 13-7 inches) metal annuli with internally reflected graphite cylinder are evaluated and benchmarked. The experimental uncertainties which are 0.00057, 0.00058 and 0.00057 respectively, and biases to the benchmark models which are - 0.00286, - 0.00242 and - 0.00168 respectively, were determined, and the experimental benchmark keff results were obtained for both detailed and simplified models. The calculation results for both detailed and simplified models using MCNP6-1.0 and ENDF/B-VII.1 agree well to the benchmark experimental results within difference less than 0.2%. The benchmarking results were accepted for the inclusion of ICSBEP Handbook.
AB - Three experimental configurations of critical assemblies, performed in 1963 at the Oak Ridge Critical Experiment Facility, which are assembled using three different diameter HEU annuli (15-9 inches, 15-7 inches and 13-7 inches) metal annuli with internally reflected graphite cylinder are evaluated and benchmarked. The experimental uncertainties which are 0.00057, 0.00058 and 0.00057 respectively, and biases to the benchmark models which are - 0.00286, - 0.00242 and - 0.00168 respectively, were determined, and the experimental benchmark keff results were obtained for both detailed and simplified models. The calculation results for both detailed and simplified models using MCNP6-1.0 and ENDF/B-VII.1 agree well to the benchmark experimental results within difference less than 0.2%. The benchmarking results were accepted for the inclusion of ICSBEP Handbook.
UR - https://www.scopus.com/pages/publications/85030478650
U2 - 10.1051/epjconf/201714606020
DO - 10.1051/epjconf/201714606020
M3 - Conference contribution
AN - SCOPUS:85030478650
T3 - EPJ Web of Conferences
BT - ND 2016
A2 - Siegler, Peter
A2 - Mondelaers, Wim
A2 - Plompen, Arjan
A2 - Hambsch, Franz-Josef
A2 - Schillebeeckx, Peter
A2 - Kopecky, Stefan
A2 - Heyse, Jan
A2 - Oberstedt, Stephan
PB - EDP Sciences
T2 - 2016 International Conference on Nuclear Data for Science and Technology, ND 2016
Y2 - 11 September 2016 through 16 September 2016
ER -