APPLICATION OF HIGH-RESOLUTION TEM TO CERAMIC SCIENCE.

V. Lou; D. G. Howitt; L. Ogbuji; D. S. Phillips; D. L. Porter; W. T. Donlon; A. H. Heuer; L. W. Hobbs; T. E. Mitchell

APPLICATION OF HIGH-RESOLUTION TEM TO CERAMIC SCIENCE.

V. Lou
, D. G. Howitt
, L. Ogbuji
, D. S. Phillips
, D. L. Porter
, W. T. Donlon
, A. H. Heuer
, L. W. Hobbs
, T. E. Mitchell

Nuclear Fuels & Materials

Research output: Contribution to conference › Paper › peer-review

Abstract

Owing to the greater complexity of ceramic systems, high-resolution techniques (lattice imaging, weak beam) often show considerable advantage over more conventional imaging modes in revealing fundamental microsctructural features which in ceramic systems are often found at the atomic level. Use of high-resolution techniques in these studies, in conjunction with conventional imaging modes, has made considerably clearer the nature of microstructural features which control commercially-significant properties of each system.

Original language	English
Pages	203-210
Number of pages	8
State	Published - 1977
Event	Dev in Electron Microsc and Anal, Proc of the Inst of Phys Electron Microsc and Anal Group Conf (EMAG 1977) - Glasgow, Scotl Duration: Sep 12 1977 → Sep 14 1977

Conference

Conference	Dev in Electron Microsc and Anal, Proc of the Inst of Phys Electron Microsc and Anal Group Conf (EMAG 1977)
City	Glasgow, Scotl
Period	09/12/77 → 09/14/77

Cite this

@conference{1a52f51e1e344b97992cbe5ab877db6b,

title = "APPLICATION OF HIGH-RESOLUTION TEM TO CERAMIC SCIENCE.",

abstract = "Owing to the greater complexity of ceramic systems, high-resolution techniques (lattice imaging, weak beam) often show considerable advantage over more conventional imaging modes in revealing fundamental microsctructural features which in ceramic systems are often found at the atomic level. Use of high-resolution techniques in these studies, in conjunction with conventional imaging modes, has made considerably clearer the nature of microstructural features which control commercially-significant properties of each system.",

author = "V. Lou and Howitt, \{D. G.\} and L. Ogbuji and Phillips, \{D. S.\} and Porter, \{D. L.\} and Donlon, \{W. T.\} and Heuer, \{A. H.\} and Hobbs, \{L. W.\} and Mitchell, \{T. E.\}",

year = "1977",

language = "English",

pages = "203--210",

note = "Dev in Electron Microsc and Anal, Proc of the Inst of Phys Electron Microsc and Anal Group Conf (EMAG 1977) ; Conference date: 12-09-1977 Through 14-09-1977",

}

TY - CONF

T1 - APPLICATION OF HIGH-RESOLUTION TEM TO CERAMIC SCIENCE.

AU - Lou, V.

AU - Howitt, D. G.

AU - Ogbuji, L.

AU - Phillips, D. S.

AU - Porter, D. L.

AU - Donlon, W. T.

AU - Heuer, A. H.

AU - Hobbs, L. W.

AU - Mitchell, T. E.

PY - 1977

Y1 - 1977

N2 - Owing to the greater complexity of ceramic systems, high-resolution techniques (lattice imaging, weak beam) often show considerable advantage over more conventional imaging modes in revealing fundamental microsctructural features which in ceramic systems are often found at the atomic level. Use of high-resolution techniques in these studies, in conjunction with conventional imaging modes, has made considerably clearer the nature of microstructural features which control commercially-significant properties of each system.

AB - Owing to the greater complexity of ceramic systems, high-resolution techniques (lattice imaging, weak beam) often show considerable advantage over more conventional imaging modes in revealing fundamental microsctructural features which in ceramic systems are often found at the atomic level. Use of high-resolution techniques in these studies, in conjunction with conventional imaging modes, has made considerably clearer the nature of microstructural features which control commercially-significant properties of each system.

UR - https://www.scopus.com/pages/publications/0017705611

M3 - Paper

AN - SCOPUS:0017705611

SP - 203

EP - 210

T2 - Dev in Electron Microsc and Anal, Proc of the Inst of Phys Electron Microsc and Anal Group Conf (EMAG 1977)

Y2 - 12 September 1977 through 14 September 1977

ER -

APPLICATION OF HIGH-RESOLUTION TEM TO CERAMIC SCIENCE.

Abstract

Conference

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