Skip to main navigation
Skip to search
Skip to main content
Idaho National Laboratory Home
Help & FAQ
Link opens in a new tab
Search content at Idaho National Laboratory
Home
Profiles
Research units
Research output
Datasets
Prizes
Activities
Press/Media
Aluminum nitride based in-core power monitor
David E. Holcomb
, Byung Soo Moon
, Don W. Miller
, Joseph W. Talnagi
Research output
:
Contribution to conference
›
Paper
›
peer-review
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Aluminum nitride based in-core power monitor'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
In-core
100%
Nitrides
100%
Power Monitor
100%
Nuclear Energy
50%
Fuel Performance
50%
Neutron
50%
Power Peaks
50%
High-temperature Reactor
50%
Solid State
50%
Sweeping
50%
Energy Research
50%
Radiation Field
50%
New Sensors
50%
Bias Voltage
50%
Free Carriers
50%
Resistors
50%
Local Power
50%
Electrical Resistance
50%
Copper Contacts
50%
Flux Sensor
50%
Polycrystalline Aluminum
50%
Parallel Plate Capacitor
50%
Aluminum Nitride Ceramics
50%
Direct Bonded Copper
50%
Engineering
Nitride
100%
Power Monitor
100%
High Temperature Reactors
50%
Nuclear Energy
50%
Polycrystalline
50%
Radiation Field
50%
Bias Voltage
50%
Parallel Plate Capacitor
50%
Body Sensor
50%
Electrical Resistance
50%
Electric Resistance
50%
Physics
Nitride
100%
Polycrystalline
50%
Radiation Distribution
50%
Parallel Plate
50%
Material Science
Aluminum Nitride
100%
Capacitor
50%
Electrical Resistance
50%
Chemical Engineering
Aluminum Nitride
100%