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Alignment of semiconductor nanowires using ion beams

  • Christian Borschel
  • , Raphael Niepelt
  • , Sebastian Geburt
  • , Christoph Gutsche
  • , Ingo Regolin
  • , Werner Prost
  • , Franz Josef Tegude
  • , Daniel Stichtenoth
  • , Daniel Schwen
  • , Carsten Ronning

Research output: Contribution to journalArticlepeer-review

64 Scopus citations

Abstract

Gallium arsenide nanowires are grown on (100) GaAs substrates, adopting the epitaxial relation and thus growing with an angle around 35° off the substrate surface. These straight nanowires are irradiated with different kinds of energetic ions. Depending on the ion species and energy, downwards or upwards bending of the nanowires is observed to increase with ion fluence. In the case of upwards bending, the nanowires can be aligned towards the ion beam direction at high fluences. Defect formation (vacancies and interstitials) within the implantation cascade is identified as the key mechanism for bending. Monte Carlo simulations of the implantation are presented to substantiate the results.

Original languageEnglish
Pages (from-to)2576-2580
Number of pages5
JournalSmall
Volume5
Issue number22
DOIs
StatePublished - Nov 16 2009

Keywords

  • Alignment
  • Ion beams
  • Irradiation
  • Nanowires

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