Advanced FIB/SEM Characterization of Nuclear Materials in the Irradiated Materials Characterization Lab

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Original language	American English
Pages (from-to)	1664-1665
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	26
Issue number	S2
DOIs	https://doi.org/10.1017/s1431927620018875
State	Published - 2020

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title = "Advanced FIB/SEM Characterization of Nuclear Materials in the Irradiated Materials Characterization Lab",

author = "Daniel Murray and Fei Teng and Narayan Poudel and Krzysztof Gofryk",

year = "2020",

doi = "10.1017/s1431927620018875",

language = "American English",

volume = "26",

pages = "1664--1665",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S2",

}

TY - JOUR

T1 - Advanced FIB/SEM Characterization of Nuclear Materials in the Irradiated Materials Characterization Lab

AU - Murray, Daniel

AU - Teng, Fei

AU - Poudel, Narayan

AU - Gofryk, Krzysztof

PY - 2020

Y1 - 2020

UR - https://www.mendeley.com/catalogue/c9d44074-791f-3572-be8d-a3810bb80bbf/

U2 - 10.1017/s1431927620018875

DO - 10.1017/s1431927620018875

M3 - Article

SN - 1431-9276

VL - 26

SP - 1664

EP - 1665

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -