7.2: High-field deuterium ion sources for neutron generators

Isidro Solano; B. Bargsten Johnson; Chris E. Holland; Paul R. Schwoebel; Kristen L. Hertz; Paul Resnick; David L. Chichester

doi:10.1109/IVNC.2010.5563202

7.2: High-field deuterium ion sources for neutron generators

Isidro Solano
, B. Bargsten Johnson
, Chris E. Holland
, Paul R. Schwoebel
, Kristen L. Hertz
, Paul Resnick
, David L. Chichester

Nuclear Nonproliferation

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

It is generally accepted that active neutron interrogation is a reliable means of detecting the presence of shielded special nuclear material, in particular highly enriched uranium. We are facilitating the deployment of portable active neutron interrogation systems for field detection applications by developing a new atomic deuterium ion source for compact, accelerator-driven neutron generators. This ion source uses high electric fields at the surfaces of microfabricated tip arrays to produce atomic deuterium ions.

Original language	English
Title of host publication	23rd International Vacuum Nanoelectronics Conference, IVNC 2010
Pages	106
Number of pages	1
DOIs	https://doi.org/10.1109/IVNC.2010.5563202
State	Published - 2010
Event	23rd International Vacuum Nanoelectronics Conference, IVNC 2010 - Palo Alto, CA, United States Duration: Jul 26 2010 → Jul 30 2010

Publication series

Name	23rd International Vacuum Nanoelectronics Conference, IVNC 2010

Conference

Conference	23rd International Vacuum Nanoelectronics Conference, IVNC 2010
Country/Territory	United States
City	Palo Alto, CA
Period	07/26/10 → 07/30/10

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10.1109/IVNC.2010.5563202

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Solano, I., Johnson, B. B., Holland, C. E., Schwoebel, P. R., Hertz, K. L., Resnick, P., & Chichester, D. L. (2010). 7.2: High-field deuterium ion sources for neutron generators. In 23rd International Vacuum Nanoelectronics Conference, IVNC 2010 (pp. 106). Article 5563202 (23rd International Vacuum Nanoelectronics Conference, IVNC 2010). https://doi.org/10.1109/IVNC.2010.5563202

@inproceedings{d4569a96dff640fb8a74fdfdbf0aa1d0,

title = "7.2: High-field deuterium ion sources for neutron generators",

abstract = "It is generally accepted that active neutron interrogation is a reliable means of detecting the presence of shielded special nuclear material, in particular highly enriched uranium. We are facilitating the deployment of portable active neutron interrogation systems for field detection applications by developing a new atomic deuterium ion source for compact, accelerator-driven neutron generators. This ion source uses high electric fields at the surfaces of microfabricated tip arrays to produce atomic deuterium ions.",

author = "Isidro Solano and Johnson, \{B. Bargsten\} and Holland, \{Chris E.\} and Schwoebel, \{Paul R.\} and Hertz, \{Kristen L.\} and Paul Resnick and Chichester, \{David L.\}",

year = "2010",

doi = "10.1109/IVNC.2010.5563202",

language = "English",

isbn = "9781424478873",

series = "23rd International Vacuum Nanoelectronics Conference, IVNC 2010",

pages = "106",

booktitle = "23rd International Vacuum Nanoelectronics Conference, IVNC 2010",

note = "23rd International Vacuum Nanoelectronics Conference, IVNC 2010 ; Conference date: 26-07-2010 Through 30-07-2010",

}

Solano, I, Johnson, BB, Holland, CE, Schwoebel, PR, Hertz, KL, Resnick, P & Chichester, DL 2010, 7.2: High-field deuterium ion sources for neutron generators. in 23rd International Vacuum Nanoelectronics Conference, IVNC 2010., 5563202, 23rd International Vacuum Nanoelectronics Conference, IVNC 2010, pp. 106, 23rd International Vacuum Nanoelectronics Conference, IVNC 2010, Palo Alto, CA, United States, 07/26/10. https://doi.org/10.1109/IVNC.2010.5563202

7.2: High-field deuterium ion sources for neutron generators. / Solano, Isidro; Johnson, B. Bargsten; Holland, Chris E. et al.
23rd International Vacuum Nanoelectronics Conference, IVNC 2010. 2010. p. 106 5563202 (23rd International Vacuum Nanoelectronics Conference, IVNC 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T2 - 23rd International Vacuum Nanoelectronics Conference, IVNC 2010

AU - Solano, Isidro

AU - Johnson, B. Bargsten

AU - Holland, Chris E.

AU - Schwoebel, Paul R.

AU - Hertz, Kristen L.

AU - Resnick, Paul

AU - Chichester, David L.

PY - 2010

Y1 - 2010

N2 - It is generally accepted that active neutron interrogation is a reliable means of detecting the presence of shielded special nuclear material, in particular highly enriched uranium. We are facilitating the deployment of portable active neutron interrogation systems for field detection applications by developing a new atomic deuterium ion source for compact, accelerator-driven neutron generators. This ion source uses high electric fields at the surfaces of microfabricated tip arrays to produce atomic deuterium ions.

AB - It is generally accepted that active neutron interrogation is a reliable means of detecting the presence of shielded special nuclear material, in particular highly enriched uranium. We are facilitating the deployment of portable active neutron interrogation systems for field detection applications by developing a new atomic deuterium ion source for compact, accelerator-driven neutron generators. This ion source uses high electric fields at the surfaces of microfabricated tip arrays to produce atomic deuterium ions.

UR - https://www.scopus.com/pages/publications/77958510401

U2 - 10.1109/IVNC.2010.5563202

DO - 10.1109/IVNC.2010.5563202

M3 - Conference contribution

AN - SCOPUS:77958510401

SN - 9781424478873

T3 - 23rd International Vacuum Nanoelectronics Conference, IVNC 2010

SP - 106

BT - 23rd International Vacuum Nanoelectronics Conference, IVNC 2010

Y2 - 26 July 2010 through 30 July 2010

ER -

7.2: High-field deuterium ion sources for neutron generators

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